ASTM E1249-10

This document is not anASTM standard and is intended only to provide the user of anASTM standard an indication of what changes have been made to the previous version. Because
it may not be technically possible to adequately depict all changes accurately, ASTM recommends that users consult prior editions as appropriate. In all cases only the current version
of the standard as published by ASTM is to be considered the official document.
Designation:E1249–00(Reapproved2005) Designation: E1249 – 10
Standard Practice for
Minimizing Dosimetry Errors in Radiation Hardness Testing
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of Silicon Electronic Devices Using Co-60 Sources
This standard is issued under the fixed designation E1249; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the Department of Defense.
1. Scope
1.1 This practice covers recommended procedures for the use of dosimeters, such as thermoluminescent dosimeters (TLD’s),
to determine the absorbed dose in a region of interest within an electronic device irradiated using a Co-60 source. Co-60 sources
are commonly used for the absorbed dose testing of silicon electronic devices.
NOTE 1—This absorbed-dose testing is sometimes called “total dose testing” to distinguish it from “dose rate testing.”
NOTE 2—The effects of ionizing radiation on some types of electronic devices may depend on both the absorbed dose and the absorbed dose rate; that
is, the effects may be different if the device is irradiated to the same absorbed-dose level at different absorbed-dose rates.Absorbed-dose rate effects are
not covered in this practice but should be considered in radiation hardness testing.
1.2 Theprincipalpotentialerrorforthemeasurementofabsorbeddoseinelectronicdevicesarisesfromnon-equilibriumenergy
deposition effects in the vicinity of material interfaces.
1.3 Information is given about absorbed-dose enhancement effects in the vicinity of material interfaces.The sensitivity of such
effects to low energy components in the Co-60 photon energy spectrum is emphasized.
1.4 Abrief description is given of typical Co-60 sources with special emphasis on the presence of low energy components in
the photon energy spectrum output from such sources.
1.5 Procedures are given for minimizing the low energy components of the photon energy spectrum from Co-60 sources, using
filtration. The use of a filter box to achieve such filtration is recommended.
1.6 Information is given on absorbed-dose enhancement effects that are dependent on the device orientation with respect to the
Co-60 source.
1.7 The use of spectrum filtration and appropriate device orientation provides a radiation environment whereby the absorbed
dose in the sensitive region of an electronic device can be calculated within defined error limits without detailed knowledge of
either the device structure or of the photon energy spectrum of the source, and hence, without knowing the details of the
absorbed-dose enhancement effects.
1.8 The recommendations of this practice are primarily applicable to piece-part testing of electronic devices. Electronic circuit
board and electronic system testing may introduce problems that are not adequately treated by the methods recommended here.
1.9 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility
of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory
limitations prior to use.
2. Referenced Documents
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2.1 ASTM Standards:
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E170 Terminology Relating to Radiation Measurements and Dosimetry
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E666 Practice for Calculating Absorbed Dose From Gamma or X Radiation
E668 Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in
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Radiation-Hardness Testing of Electronic Devices
E1250 Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60
Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
2.2 International Commission on Radiation Units and Measurements Reports:
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This practice is under the jurisdiction of ASTM Committee E10 on Nuclear Technology and Applications and is the direct responsibility of Subcommittee E10.07 on
Radiation Dosimetry for Radiation Effects on Materials and Devices.
Current edition approved JuneDec. 1, 2005.2010. Published June 2005.January 2011. Originally approved in 1988. Last previous edition approved in 20002005 as
E1249–00.E1249–00(2005). DOI: 10.1520/E1249-00R05.10.1520/E1249-10.
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ForreferencedASTMstandards,visittheASTMwebsite,www.astm.org,orcontactASTMCustomerServiceatservice@astm.org.For Annual Book of ASTM Standards
volume information, refer to
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