ASTM D1005-95(2001)

NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
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Designation:D1005–95 (Reapproved 2001)
Standard Test Method for
Measurement of Dry-Film Thickness of Organic Coatings
Using Micrometers
This standard is issued under the fixed designation D 1005; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision. A number in parentheses indicates the year of last reapproval. A
superscript epsilon (e) indicates an editorial change since the last revision or reapproval.
This standard has been approved for use by agencies of the Department of Defense.
1. Scope D 2370 Test Method for Tensile Properties of Organic
Coatings
1.1 This test method covers the measurement of film thick-
ness of dried films of paint, varnish, lacquer, and related
3. Significance and Use
products using micrometers. Procedures A and B utilize sta-
3.1 This test method is particularly applicable to the mea-
tionary micrometers and Procedures C and D, hand-held
surement of free films and is also satisfactory for the measure-
micrometers. Procedures A and C are not recommended for
ment of films on laboratory test panels.
films less than 12.5 µm ( 0.5 mils) in thickness. The minimum
3.2 The accuracy and precision of the thickness measure-
thickness required for Procedures B and D is a function of that
ments may be influenced by the deformability of the coating.
required to enable removal of the sample as a free film.
This test method is not applicable to coatings that are readily
1.2 The procedures appear as follows:
deformable under the load of the measuring instrument.
1.2.1 Procedure A—Stationary micrometer for measuring
3.3 The accuracy and precision of the thickness measure-
coatings applied to plane rigid surfaces.
ments are also influenced by the uniformity of the substrate
1.2.2 Procedure B—Stationary micrometer for measuring
when the coatings are applied to laboratory test panels.
free films.
1.2.3 Procedure C—Hand-held micrometer for measuring
4. Apparatus
coatings applied to plane rigid surfaces.
4.1 Procedures A and B:
1.2.4 Procedure D—Hand-held micrometer for measuring
4.1.1 The apparatus shall consist of a dial comparator, dial
free films.
indicator, or micrometer.Arigid base is required for mounting
1.3 The values stated in SI units are to be regarded as the
the dial comparator or dial indicator gages. The presser foot of
standard. The values given in parentheses are for information
the micrometer or dial indicator shall be circular, from 1.5 to
only.
1 1
3.0 mm ( ⁄16 to ⁄8 in.) in diameter, and shall be flat on the
1.4 This standard does not purport to address the safety
bottom.Thepresserfootshallbefixedtoanindicatorthatreads
concerns, if any, associated with its use. It is the responsibility
to 2.5 µm (0.1 mil). The load on the presser foot shall be
of the user of this standard to establish appropriate safety and
between 140 and 275 kPa (20 and 40 psi ). For Procedure B, a
health practices and determine the applicability of regulatory
smooth uncoated test plate is also required.
limitations prior to use.
4.1.2 Verify the accuracy of instrument calibration by set-
2. Referenced Documents ting to zero with the anvils closed followed by measuring
shims of known thicknesses or standards specifically designed
2.1 ASTM Standards:
for this purpose. Record the standard thickness gage measure-
D 823 Practices for Producing Films of Uniform Thickness
2 mentandthemicrometerreading.Usetheseresultstoconstruct
of Paint, Varnish, and Related Products on Test Panels
a calibration curve.
4.2 Procedures C and D—The apparatus shall consist of a
hand-held micrometer. The anvils of the micrometer shall be
This test method is under the jurisdiction of ASTM Committee D01 on Paint
1 1
and Related Coatings, Materials, andApplications and is the direct responsibility of
circular, from 1.5 to 3.0 mm ( ⁄16 to ⁄8 in.) in diameter, with flat
Subcommittee D01.23 on Physical Properties of Applied Paint Films.
bottoms. Verify the accuracy of instrument calibration by
Current edition approved Feb. 15, 1995. Published April 1995. Originally
e1 setting to zero with the anvils closed followed by measuring
published 1949. Last previous edition D 1005 – 84 (1990) .
Annual Book of ASTM Standards, Vol 06.01. shims of known thicknesses or standards specifically designed
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
D1005
for this purpose. Record the standard thickness gage measure-
mentandthemicrometerreading.Usetheseresultstoconstruct
a calibration curve.
5. Test Specimen
5.1 Procedures A and C—Apply test films to a suitable
plane, rigid base material from which the dried film may be
satisfactorily removed. The panels shall be of sufficient size to
permit film thickness measurements to be made 25 mm (1 in.)
from any edge.
5.1.1 Coatings should be applied in accordance with Prac-
tices D 823 or as agreed upon between the purchaser and the
seller.
5.2 Procedures B and D—Free films of the test material are
required. Alternatively, the test materials can be applied to an
appropriate substrate in order that they can be removed as free
films without deformation. If the method of specimen prepa-
ration affects the film forming properties of the test material or
FIG. 1
requires cutting or scraping to remove the free film, use
Procedures A or C instead.
5.2.1 Free films may be prepared in accordance with Test
Method D 2370.
taken. Close the gage slowly with care not to distort the film
and take a reading, estimating to 2.5 µm (0.1 mil).
6. Procedure
6.2.4 The difference in the gage readings is the thickness of
6.1 Procedure A:
the film. Record to 2.5 µm (0.1 mil).
6.1.1 Mount the test panel rigidly on a suitable base. Clamp
6.2.5 When conditions permit, perform a minimum of three
or hold it to the base in such a way that there will be no
determinations adjacent to one another on each film.
movement or spring of the panel during the film thickness
6.3 Procedure C:
measurement.
6.3.1 Hold the hand-held micrometer in such a manner that
6.1.2 Close the gage slowly until contact is made, but
the micrometer can be steadied against a film surface. Separate
without visible distortion of the film. Read the gage, estimating
the micrometer anvils to a distance at least twice that of the
to 2.5 µm (0.1 mil), and record the reading.
film thickness to be measured.
6.1.3 Open the gage and remove the film carefully from the
6.3.2 Place the coated base material between anvil contacts.
area where the measurement was taken. Any suitable means,
Be sure to align the panel so that it is perpendicular to the
chemical or mechanical, may be used to remove the film,
contact points. Carefully bring the micrometer anvil into
taking care not to distort the panel. Close the gage, slowly on
contact with the film by releasing the spring tension or rotating
the area from which the film was removed, and take a reading,
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