Standard Test Methods for Measurement of Electrical Performance and Spectral Response of Nonconcentrator Multijunction Photovoltaic Cells and Modules

SIGNIFICANCE AND USE
In a series-connected multijunction PV device, the incident total and spectral irradiance determines which component cell will generate the smallest photocurrent and thus limit the current through the entire series-connected device. This current-limiting behavior also affects the fill factor of the device. Because of this, special techniques are needed to measure the correct I-V characteristics of multijunction devices under the desired reporting conditions (see Test Methods E 1036).
These test methods use a numerical parameter called the current balance which is a measure of how well the test conditions replicate the desired reporting conditions. When the current balance deviates from unity by more than 0.03, the uncertainty of the measurement may be increased.
The effects of current limiting in individual component cells can cause problems for I-V curve translations to different temperature and irradiance conditions, such as the translations recommended in Test Methods E 1036. For example, if a different component cell becomes the limiting cell as the irradiance is varied, a discontinuity in the current versus irradiance characteristic may be observed. For this reason, it is recommended that I-V characteristics of multijunction devices be measured at temperature and irradiance conditions close to the desired reporting conditions.
Some multijunction devices have more than two terminals which allow electrical connections to each component cell. In these cases, the special techniques for spectral response measurements are not needed because the component cells can be measured individually. However, these I-V techniques are still needed if the device is intended to be operated as a two-terminal device.
Using these test methods, the spectral response is typically measured while the individual component cell under test is illuminated at levels that are less than Eo. Nonlinearity of the spectral response may cause the measured results to differ from the spectral ...
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1.1 These test methods provide special techniques needed to determine the electrical performance and spectral response of two-terminal, multijunction photovoltaic (PV) devices, both cell and modules.
1.2 These test methods are modifications and extensions of the procedures for single-junction devices defined by Test Methods E 948, E 1021, and E 1036.
1.3 These test methods do not include temperature and irradiance corrections for spectral response and current-voltage (I-V) measurements. Procedures for such corrections are available in Test Methods E 948, E 1021, and E 1036.
1.4 These test methods apply only to nonconcentrator terrestrial multijunction photovoltaic cells and modules.
1.5 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

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Publication Date
31-Aug-2005
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ASTM E2236-05a - Standard Test Methods for Measurement of Electrical Performance and Spectral Response of Nonconcentrator Multijunction Photovoltaic Cells and Modules
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NOTICE: This standard has either been superseded and replaced by a new version or withdrawn.
Contact ASTM International (www.astm.org) for the latest information
Designation:E2236–05a
Standard Test Methods for
Measurement of Electrical Performance and Spectral
Response of Nonconcentrator Multijunction Photovoltaic
1
Cells and Modules
This standard is issued under the fixed designation E2236; the number immediately following the designation indicates the year of
original adoption or, in the case of revision, the year of last revision.Anumber in parentheses indicates the year of last reapproval.A
superscript epsilon (´) indicates an editorial change since the last revision or reapproval.
1. Scope E1021 Test Method for Spectral Responsivity Measure-
ments of Photovoltaic Devices
1.1 Thesetestmethodsprovidespecialtechniquesneededto
E1036 TestMethodsforElectricalPerformanceofNoncon-
determine the electrical performance and spectral response of
centrator Terrestrial Photovoltaic Modules and Arrays
two-terminal, multijunction photovoltaic (PV) devices, both
Using Reference Cells
cell and modules.
E1040 Specification for Physical Characteristics of Non-
1.2 These test methods are modifications and extensions of
concentrator Terrestrial Photovoltaic Reference Cells
the procedures for single-junction devices defined by Test
E1125 Test Method for Calibration of Primary Non-
Methods E948, E1021, and E1036.
Concentrator Terrestrial Photovoltaic Reference Cells Us-
1.3 These test methods do not include temperature and
ing a Tabular Spectrum
irradiancecorrectionsforspectralresponseandcurrent-voltage
E1328 Terminology Relating to Photovoltaic Solar Energy
(I-V)measurements.Proceduresforsuchcorrectionsareavail-
Conversion
able in Test Methods E948, E1021, and E1036.
E1362 Test Method for Calibration of Non-Concentrator
1.4 These test methods apply only to nonconcentrator ter-
Photovoltaic Secondary Reference Cells
restrial multijunction photovoltaic cells and modules.
G138 Test Method for Calibration of a Spectroradiometer
1.5 This standard does not purport to address all of the
Using a Standard Source of Irradiance
safety concerns, if any, associated with its use. It is the
G173 Tables for Reference Solar Spectral Irradiances: Di-
responsibility of the user of this standard to establish appro-
rect Normal and Hemispherical on 37° Tilted Surface
priate safety and health practices and determine the applica-
bility of regulatory limitations prior to use.
3. Terminology
2. Referenced Documents 3.1 Definitions—definitions of terms used in this standard
2 may be found in Terminology E772 and in Terminology
2.1 ASTM Standards:
E1328.
E772 Terminology Relating to Solar Energy Conversion
3.2 Definitions of Terms Specific to This Standard:
E927 Specification for Solar Simulation for Photovoltaic
3.2.1 multijunction device, n—a photovoltaic device com-
Testing
posedofmorethanonephotovoltaicjunctionstackedontopof
E948 Test Method for Electrical Performance of Photovol-
each other and electrically connected in series.
taicCellsUsingReferenceCellsUnderSimulatedSunlight
3.2.2 component cells, n—the individual photovoltaic junc-
E973 Test Method for Determination of the Spectral Mis-
tions of a multijunction device.
match Parameter Between a Photovoltaic Device and a
3.3 Symbols:
Photovoltaic Reference Cell
1
C = reference cell calibration constant under the ref-
These test methods are under the jurisdiction of ASTM Committee E44 on
2 −1
Solar, Geothermal and Other Alternative Energy Sources and is the direct respon-
erence spectrum, A·m ·W
−2
sibility of SubcommitteeE44.09 on Photovoltaic Electric Power Conversion.
E = total irradiance of reporting conditions, W·m
o
Current edition approved Sept. 1, 2005. Published October 2005. Originally −2 −1
E (l) = source spectral irradiance, W·m ·nm or
S
approved in 2002. Last previous edition approved in 2005 as E2236–05. DOI:
−2 −1
W·m ·µm
10.1520/E2236-05A.
−2 −1
2
For referenced ASTM standards, visit the ASTM website, www.astm.org, or E (l) = reference spectral irradiance, W·m ·nm or
R
−2 −1
contact ASTM Customer Service at service@astm.org. For Annual Book of ASTM
W·m ·µm
Standards volume information, refer to the standard’s Document Summary page on
FF = fill factor, dimensionless
the ASTM website.
Copyright © ASTM International, 100 Barr Harbor Drive, PO Box C700, West Conshohocken, PA 19428-2959, United States.
1

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E2236–05a
of the spectral response may cause the measured results to
i = subscript index associated with an individual
differ from the spectral response at the illumination levels of
component cell
actual use conditions.
I = current of test device under the reference spec-
o
trum, A
I = current of test device under the source spectrum, 5. Summary of Test Methods
A
5.1 Spectralresponsemeasurementsofthedeviceundertest
I = short-circuit current, A
sc
are accomplished using light- and voltage-biasing techniques
I = short-circuit current o
...

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