SIST EN 61300-3-23:1999

SLOVENSKI STANDARD
01-maj-1999
Fibre optic interconnecting devices and passive components - Basic test and
measurement procedures - Part 3-23: Examination and measurements - Fibre
position relative to ferrule endface (IEC 61300-3-23:1998)
Fibre optic interconnecting devices and passive components - Basic test and
measurement procedures -- Part 3-23: Examination and measurements - Fibre position
relative to ferrule endface
Lichtwellenleiter - Verbindungselemente und passive Bauteile - Grundlegende Prüf- und
Meßverfahren -- Teil 3-23: Untersuchungen und Messungen - Lage der Faser bezogen
auf die Stiftendfläche
Dispositifs d'interconnexion et composants passifs à fibres optiques - Méthodes
fondamentales d'essais et de mesures -- Partie 3-23: Examens et mesures - Position de
la fibre par rapport à l'extrémité de l'embout
Ta slovenski standard je istoveten z: EN 61300-3-23:1998
ICS:
33.180.20 3RYH]RYDOQHQDSUDYH]D Fibre optic interconnecting
RSWLþQDYODNQD devices
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

NORME
CEI
INTERNATIONALE
IEC
61300-3-23
INTERNATIONAL
Première édition
STANDARD
First edition
1998-04
Dispositifs d’interconnexion et composants
passifs à fibres optiques –
Méthodes fondamentales d’essais et de mesures –
Partie 3-23:
Examens et mesures –
Position de la fibre par rapport à l'extrémité
de l'embout
Fibre optic interconnecting devices
and passive components –
Basic test and measurement procedures –
Part 3-23:
Examinations and measurements –
Fibre position relative to ferrule endface
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61300-3-23 © IEC:1998 – 3 –
CONTENTS
Page
FOREWORD . 5
Clause
1 General. 7
1.1 Scope and object . 7
1.2 General description. 7
2 Apparatus. 9
2.1 Method 1 – Two-dimensional surface analysis . 9
2.2 Method 2 – Three-dimensional surface analysis by interferometry system. 11
2.3 Method 3 – Two-dimensional surface analysis by interferometry system . 13
3 Procedure. 17
3.1 Measurement regions. 17
3.2 Method 1 – Two-dimensional surface analysis . 19
3.3 Method 2 – Three-dimensional surface analysis by interferometry system. 23
3.4 Method 3 – Two-dimensional surface analysis by interferometry system . 27
4 Details to be specified . 31
4.1 Method 1 – Two-dimensional surface analysis . 31
4.2 Method 2 – Three-dimensional interferometry analysis . 31
4.3 Method 3 – Two-dimensional surface analysis by interferometry system . 31
Figures
1 Fibre undercut and protrusion of spherically polished ferrule endface. 7
2 Apparatus for two-dimensional surface analysis. 9
3 Apparatus for three-dimensional surface analysis by interferometry system. 13
4 Apparatus for two-dimensional surface analysis by interferometry system . 15
5 Ferrule endface and measurement regions . 17
6 Converted ferrule endface profile. 21
7 Types of converted ferrule endface profile . 21
8 Ferrule endface surface . 25
9 Fitting region and averaging region of the ferrule endface surface. 25
10 Converted endface surface of the global ferrule (see figure 8) . 25
11 Converted ferrule endface surface subtracting the extracting region (see figure 9) . 27
12 Interferometry image from the microscope and the acquired intensity light
curve relevant to the selected row with the fitting theoretical function . 29
A.1 Acquired ferrule profile and rectified profile. 35
Annex A (informative) – Undercut or protrusion evaluation . 33

61300-3-23 © IEC:1998 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
––––––––
FIBRE OPTIC INTERCONNECTING DEVICES AND
PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –
Part 3-23: Examination and measurements –
Fibre position relative to ferrule endface
FOREWORD
1) The IEC (International Electrotechnical Commission) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of the IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, the IEC publishes International Standards. Their preparation is
entrusted to technical committees; any IEC National Committee interested in the subject dealt with may
participate in this preparatory work. International, governmental and non-governmental organizations liaising
with the IEC also participate in this preparation. The IEC collaborates closely with the International Organization
for Standardization (ISO) in accordance with conditions determined by agreement between the two
organizations.
2) The formal decisions or agreements of the IEC on technical matters express, as nearly as possible, an
international consensus of opinion on the relevant subjects since each technical committee has representation
from all interested National Committees.
3) The documents produced have the form of recommendations for international use and are published in the form
of standards, technical reports or guides and they are accepted by the National Committees in that sense.
4) In order to promote international unification, IEC National Committees undertake to apply IEC International
Standards transparently to the maximum extent possible in their national and regional standards. Any
divergence between the IEC Standard and the corresponding national or regional standard shall be clearly
indicated in the latter.
5) The IEC provides no marking procedure to indicate its approval and cannot be rendered responsible for any
equipment declared to be in conformity with one of its standards.
6) Attention is drawn to the possibility that some of the elements of this International Standard may be the subject
of patent rights. The IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 61300-3-23 has been prepared by subcommittee 86B: Fibre optic
interconnecting devices and passive components, of IEC technical committee 86: Fibre optics.
The text of this standard is based on the following documents:
FDIS Report on voting
86B/1056/FDIS 86B/1083/RVD
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
Annex A is for information only.
IEC 61300 consists of the following parts, under the general title Fibre optic interconnecting
devices and passive components – Basic test and measurement procedures:
Part 1: General and guidance
Part 2: Tests
Part 3: Examination and measurements

61300-3-23 © IEC:1998 – 7 –
FIBRE OPTIC INTERCONNECTING DEVICES AND
PASSIVE COMPONENTS –
BASIC TEST AND MEASUREMENT PROCEDURES –
Part 3-23: Examination and measurements –
Fibre position relative to ferrule endface
1 General
1.1 Scope and object
The purpose of the procedure described this part of IEC 61300 is to measure the fibre position
relative to the ferrule endface of a spherically polished ferrule, that is a fibre undercut or a fibre
protrusion.
1.2 General description
The fibre undercut +w or protrusion –w of a spherically polished ferrule is defined as the
average distance between a fibre endface and a virtual spherical surface which is fitted to the
spherically polished ferrule endface. It is assumed that a circle region of the ferrule endface,
which is centred to the ferrule axis, is spherical, although in practice the endface is often
aspherical.
Virtual spherical surface
Fibre endface
Spherically polished
w
ferrule endface
Ferrule Fibre Adhesive
IEC  502/98
Figure 1a - Fibre undercut +w
−w
IEC  503/98
Figure 1b - Fibre protrusion −w
Figure 1 – Fibre undercut and protrusion of spherically polished ferrule endface

61300-3-23 © IEC:1998 – 9 –
Three methods are described in this standard for measuring the fibre undercut or protrusion:
a) method 1: analyzing the endface with a two-dimensional surface analyzer;
b) method 2: analyzing the endface with a three-dimensional interferometry type surface
analyzer;
c) method 3: analyzing the endface with a two-dimensional interferometry type surface
analyzer.
Method 1 is the reference method.
2 Apparatus
2.1 Method 1 – Two-dimensional surface analysis
The apparatus shown in figure 2 consists of a suitable ferrule holder, a positioning stage and a
two-dimensional surface analyzer.
2.1.1 Ferrule holder
The ferrule holder is a suitable device to hold the ferrule in a fixed vertical position, or in a tilted
position in the case of an angled ferrule type.
2.1.2 Positioning stage
The ferrule holder is fixed to the positioning stage, which shall enable the holder to be moved
to the appropriate position. The stage shall have enough rigidity so as to measure the ferrule
endface with a precision of some nanometres.
Two-dimensional surface analyzer
Profilometer
Probe
Ferrule endface
Ferrule holder
Ferrule
Profile data
processing unit
Monitor
Positioning stage
IEC  504/98
Figure 2 – Apparatus for two-dimensional surface analysis

61300-3-23 © IEC:1998 – 11 –
2.1.3 Two-dimensional surface analyzer
The two-dimensional surface analyzer shall have an ability to measure the profile of the ferrule
endface with an accuracy better than ±10 nm. The analyzer shall consist of a profilometer, a
profile data processing unit and a monitor.
The profilometer shall be equipped with a wedge type probe arranged so that the motion of the
trace is perpendicular to the ferrule axis.
The profile data processing unit shall be able to process the profile data so as to measure the
fibre undercut or protrusion: the unit calculates an ideal circle fitted to the spherical ferrule
endface from the measured profile data and calculates converted data from the measured
profile data by extracting the ideal circle data.
The monitor shall display the measured and calculated profiles.
2.2 Method 2 – Three-dimensional surface analysis by interferometry system
The apparatus shown in figure 3 consists of a suitable ferrule holder, a positioning stage and a
three-dimensional interferometry analyzer.
2.2.1 Ferrule holder
The ferrule holder is a suitable device to hold the ferrule in a fixed vertical position, or in a tilted
position in the case of an angled ferrule type.
2.2.2 Positioning stage
The ferrule holder is fixed to the positioning stage, which shall enable the holder to be moved
to the appropriate position. The stage shall have enough rigidity so as to measure the ferrule
endface with a precision of some nanometres.
2.2.3 Three-dimensional interferometry analyzer
The three-dimensional interferometry analyzer shall have an ability to measure the surface of
the ferrule endface with an accuracy better than ±10 nm. The analyzer shall consist of a
microscope unit, a surface data processing unit, and a monitor.
The microscope unit shall consist of an interference microscope, an actuator, and an image
scanner. The interference microscope equipped with an objective is arranged so that its motion
is parallel to the axis of the ferrule. The actuator transports the objective vertically. The image
scanner converts interference image signals into position data.
The surface data processing unit shall be able to process the position data so as to measure
the fibre undercut or protrusion: the unit calculates an ideal spherical surface fitted to the
spherical ferrule endface from the measured surface data and calculates converted surface
data from the measured surface data by extracting the ideal spherical surface data. The unit
also has an ability to correct the surface data taking into account the difference in refractive
indices and absorption coefficients of the fibre and the ferrule.
The monitor shall display the measured and calculated three-dimensional surface profiles.

61300-3-23 © IEC:1998 – 13 –
Three-dimensional interferometry analyzer
Microscope unit
Interference
microscope
Surface data
processing unit
Actuator
Objective
Monitor
Ferrule endface
Ferrule holder
Ferrule
Positioning stage
IEC  505/98
Figure 3 – Apparatus for three-dimensional surface analysis by interferometry system
2.3 Method 3 – Two-dimensional surface analy
...