SIST-TS CEN/TS 17010:2017

SLOVENSKI STANDARD
SIST-TS CEN/TS 17010:2017
01-februar-2017
1DQRWHKQRORJLMD1DYRGLORJOHGHPHUMHQLKYHOLþLQ]DXJRWDYOMDQMHODVWQRVWL
QDQRGHOFHYLQPDWHULDORYNLMLKYVHEXMHMR
Nanotechnologies - Guidance on measurands for characterising nano-objects and
materials that contain them
Nanotechnologien - Leitfaden über Messgrößen zur Charakterisierung von Nanoobjekten
und von Werkstoffen, die welche enthalten
Nanotechnologies - Guide sur les mesurandes pour la caractérisation de nano-objects et
des matériaux les contenant
Ta slovenski standard je istoveten z: CEN/TS 17010:2016
ICS:
07.120 Nanotehnologije Nanotechnologies
SIST-TS CEN/TS 17010:2017 en,fr,de
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

---------------------- Page: 1 ----------------------

SIST-TS CEN/TS 17010:2017

---------------------- Page: 2 ----------------------

SIST-TS CEN/TS 17010:2017


CEN/TS 17010
TECHNICAL SPECIFICATION

SPÉCIFICATION TECHNIQUE

December 2016
TECHNISCHE SPEZIFIKATION
ICS 07.120
English Version

Nanotechnologies - Guidance on measurands for
characterising nano-objects and materials that contain
them
Nanotechnologies - Guide sur les mesurandes pour la Nanotechnologien - Leitfaden über Messgrößen zur
caractérisation de nano-objects et des matériaux les Charakterisierung von Nanoobjekten und von
contenant Werkstoffen, die welche enthalten
This Technical Specification (CEN/TS) was approved by CEN on 12 October 2016 for provisional application.

The period of validity of this CEN/TS is limited initially to three years. After two years the members of CEN will be requested to
submit their comments, particularly on the question whether the CEN/TS can be converted into a European Standard.

CEN members are required to announce the existence of this CEN/TS in the same way as for an EN and to make the CEN/TS
available promptly at national level in an appropriate form. It is permissible to keep conflicting national standards in force (in
parallel to the CEN/TS) until the final decision about the possible conversion of the CEN/TS into an EN is reached.

CEN members are the national standards bodies of Austria, Belgium, Bulgaria, Croatia, Cyprus, Czech Republic, Denmark, Estonia,
Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia, Lithuania,
Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland, Turkey and
United Kingdom.





EUROPEAN COMMITTEE FOR STANDARDIZATION
COMITÉ EUROPÉEN DE NORMALISATION

EUROPÄISCHES KOMITEE FÜR NORMUNG

CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2016 CEN All rights of exploitation in any form and by any means reserved Ref. No. CEN/TS 17010:2016 E
worldwide for CEN national Members.

---------------------- Page: 3 ----------------------

SIST-TS CEN/TS 17010:2017
CEN/TS 17010:2016 (E)
Contents Page
European foreword . 7
Introduction . 8
1 Scope . 9
2 Normative references . 9
3 Terms and definitions . 9
3.1 General core terms . 10
3.2 Measurand terms . 10
4 Symbols and abbreviations . 15
5 Approaches to identify measurands to characterize nano-objects and their agglomerates
and aggregates, and materials containing nano-objects . 17
5.1 Method . 17
5.2 Types of measurands . 17
5.3 State of nano-objects . 18
Table 1 —Different states of Nano-objects . 18
6 Measurands related to size and shape measurement of nano-objects and their
agglomerates and aggregates . 18
6.1 Introduction . 18
6.2 Measurands related to size and shape measurement . 19
6.3 Measurands related to size and shape measurement in aerosols . 19
6.3.1 Overview . 19
Table 2 — Measurands related to the size and shape measurement in aerosols . 20
6.3.2 General relevant standard . 21
6.3.3 Electrical low-pressure impaction (ELPI) . 21
6.3.4 Cascade impactors . 22
6.3.5 Differential mobility analysing system (DMAS) . 22
6.3.6 Relevant standards . 22
6.3.7 Optical Particulate Counters (OPC) . 23
6.3.8 Relevant standards . 23
6.3.9 Aerodynamic Particle Sizing (APS) . 23
6.3.10 Transmission electron microscopy (TEM) combined with TEM grid samplers . 23
6.3.11 Relevant standards . 24
6.3.12 Scanning electron microscopy (SEM). 24
6.3.13 Relevant standards . 24
6.4 Measurands related to size and shape measurement in powders . 25
6.4.1 Overview . 25
Table 3 — Measurands related to the size and shape measurement in powders . 25
6.4.2 Relevant standards . 26
6.4.3 Scanning electron microscopy (SEM). 26
6.4.4 Relevant standards . 26
6.4.5 Gas adsorption, the BET method . 26
6.4.6 Relevant standards . 26
6.4.7 Laser diffraction (LD) . 26
6.4.8 Relevant standards . 27
6.4.9 X-ray diffraction (XRD) . 27
2

---------------------- Page: 4 ----------------------

SIST-TS CEN/TS 17010:2017
CEN/TS 17010:2016 (E)
6.4.10 Relevant standards . 27
6.4.11 Raman spectroscopy . 27
6.5 Measurands related to size and shape measurements of nano-objects in liquid dispersions
. 27
6.5.1 Overview . 27
Table 4 — Measurands related to the size and shape measurement in liquids . 28
6.5.2 Centrifugal liquid sedimentation (CLS) . 29
6.5.3 Relevant standards . 29
6.5.4 Dynamic light scattering (DLS) . 30
6.5.5 Relevant standards . 30
6.5.6 Laser diffraction (LD) . 30
6.5.7 Relevant standards . 30
6.5.8 Small angle X-ray scattering (SAXS) . 30
6.5.9 Relevant standards . 31
6.5.10 Particle tracking analysis (PTA) . 31
6.5.11 Relevant standards . 31
6.5.12 Electron microscopy . 31
6.6 Measurands related to size and shape measurement on surfaces (microscopy techniques)
. 31
6.6.1 Overview . 31
Table 5 — Measurands related to the size and shape measurement on surfaces . 32
6.6.2 Scanning electron microscopy (SEM) . 32
6.6.3 Atomic force microscopy (AFM) . 32
6.6.4 Relevant standards . 33
7 Measurands related to chemical analysis of nano-objects and their agglomerates and
aggregates . 33
7.1 Introduction . 33
7.2 Measurands related to surface chemical analysis of nano-objects and their agglomerates
and aggregates . 34
7.2.1 Measurands . 34
Table 6 — Measurands related to the surface chemical analysis of nano-objects and their
agglomerates and aggregates . 34
7.2.2 Auger electron spectroscopy (AES) . 35
7.2.3 Relevant standards . 35
7.2.4 Electron energy loss spectroscopy (EELS) . 36
7.2.5 Relevant standards . 36
7.2.6 Secondary ion mass spectroscopy (SIMS) . 36
7.2.7 Relevant standards . 36
7.2.8 X-ray fluorescence spectroscopy (XRF) . 36
7.2.9 Relevant standards . 37
7.2.10 X-ray diffraction (XRD) . 37
7.2.11 Relevant standards . 37
7.2.12 X-ray photoelectron spectroscopy (XPS) . 38
7.2.13 Relevant standards . 38
7.2.14 Energy dispersive X-ray spectroscopy (EDS or EDX) . 38
7.3 Measurands related to the chemical analysis of nano-objects as bulk samples . 39
7.3.1 Measurands . 39
Table 7 — Measurands related to the chemical analysis of nano-objects and their agglomerates
and aggregates . 39
7.3.2 Differential scanning calorimetry (DSC) . 41
7.3.3 Relevant standards . 41
3

---------------------- Page: 5 ----------------------

SIST-TS CEN/TS 17010:2017
CEN/TS 17010:2016 (E)
7.3.4 Fourier transform infrared spectroscopy (FTIR) . 41
7.3.5 Relevant standards . 42
7.3.6 Thermal analysis with evolved gas analyser (EGA) plus FTIR or QMS . 42
7.3.7 Relevant standards . 42
7.3.8 Ultraviolet–visible spectroscopy (UV-Vis) . 42
7.3.9 Relevant standards . 43
7.3.10 Raman spectroscopy . 43
7.3.11 Inductively coupled plasma (ICP) techniques . 43
7.3.12 Contact Angle . 43
8 Measurands related to mass and density . 43
8.1 Introduction . 43
8.2 Aerosols . 44
8.2.1 Measurands . 44
Table 8 — Measurands associated with mass and density measurement of nano-objects in an
aerosol . 44
8.2.2 Relevant standards . 44
8.2.3 Aerosol particle mass analyser (APM) . 44
8.2.4 Time of flight mass spectrometry . 44
8.3 Powders . 45
8.3.1 Measurands . 45
Table 9 — Measurands associated with mass and density measurement of nano-objects in
powder form . 45
8.3.2 Pycnometry . 45
8.3.3 Relevant standards . 45
8.4 Liquid dispersions . 45
8.4.1 Measurands . 45
Table 10 — Measurands related to mass and density for nano-objects in liquid dispersions. 46
8.4.2 Relevant standards . 46
8.4.3 Centrifugal liquid sedimentation (Isopycnic method) . 46
8.4.4 Static light scattering (SLS) . 47
8.4.5 Resonant mass measurement (RMM) . 47
9 Measurands related to charge - Liquid dispersions . 47
9.1 Measurands . 47
Table 11 — Measurands related to charge . 47
9.2 Relevant standards . 48
9.3 Electrophoretic light scattering . 48
9.4 Electroaccoustic phenomena measurements . 48
10 Measurands related to crystallinity . 48
10.1 Measurands . 48
Table 12 — Measurands related to crystallinity . 49
10.2 Small-angle/wide-angle X-ray scattering (SAXS/WAXS) . 50
10.3 X-ray diffraction (XRD) . 50
10.4 Scanning/ electron microscopy (SEM) . 50
10.5 High-resolution transmission electron microscopy (HRTEM) . 51
10.6 Electron diffraction . 51
10.7 Neutron diffraction . 51
10.8 Electron backscatter diffraction (EBSD) . 51
10.9 Reflection high-energy electron diffraction (RHEED) and low-energy electron diffraction
(LEED). 51
10.10 Differential scanning calorimetry (DSC) . 52
4

---------------------- Page: 6 ----------------------

SIST-TS CEN/TS 17010:2017
CEN/TS 17010:2016 (E)
10.11 Nuclear magnetic resonance (NMR) crystallography . 52
10.12 Raman crystallography . 52
10.13 Relevant standards . 52
11 Optical properties measurands . 52
11.1 Introduction . 52
11.2 Measurands . 52
Table 13 — Measurands for optical properties . 53
11.3 Spectroscopy techniques. 53
11.4 Relevant standards . 54
12 Electrical and electronic measurands . 54
12.1 Measurands . 54
Table 14 — Measurands related to electrical and electronic measurements. 55
12.2 Techniques . 56
12.2.1 2 or 4 point conductance measurements . 56
12.2.2 Angle-resolved ultraviolet photoemission spectroscopy (ARPES) . 56
12.2.3 Scanning tunnelling microscopy (STM) . 56
12.2.4 Conductive atomic force microscopy . 56
12.2.5 Piezoforce microscopy (PFM) . 56
13 Magnetic measurands . 57
13.1 Introduction . 57
13.2 Measurands . 57
Table 15 —Measurands related to magnetic properties of solid nano-composite materials . 57
13.3 Techniques . 58
13.3.1 Superconducting quantum interference device (SQUID) . 58
13.3.2 Vibrating sample magnetometer (VSM) . 59
13.3.3 Mössbauer spectroscopy . 59
13.3.4 Electron paramagnetic resonance (EPR) spectroscopy . 59
13.3.5 Magneto-optical Kerr-effect (MOKE) . 59
13.3.6 Magnetic force microscopy (MFM) . 59
13.3.7 Scanning Hall effect microscopy . 59
13.3.8 Spin-polarized scanning tunnelling microscopy (SP-STM) . 60
13.3.9 Relevant standards . 60
14 Thermal measurands . 60
14.1 Measurands .
...