ISO 21980:2020
(Main)Space systems — Evaluation of radiation effects on Commercial-Off-The-Shelf (COTS) parts for use on low-orbit satellite
Space systems — Evaluation of radiation effects on Commercial-Off-The-Shelf (COTS) parts for use on low-orbit satellite
This document outlines the evaluation methods for environmental tests that can be conducted on COTS (Commercial-Off-The-Shelf) spacecraft parts intended for use on LEO satellites. The radiation effects considered consist of total dosage, single event, and displacement damage. In addition, this document describes tests that are useful for satellites operating in LEO.
Systèmes spatiaux — Évaluation des effets des radiations sur les parties commerciales sur étagère (COTS) destinées aux satellites à orbite basse
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INTERNATIONAL ISO
STANDARD 21980
First edition
2020-01
Space systems — Evaluation of
radiation effects on Commercial-Off-
The-Shelf (COTS) parts for use on low-
orbit satellite
Systèmes spatiaux — Évaluation des effets des radiations sur les
parties commerciales sur étagère (COTS) destinées aux satellites à
orbite basse
Reference number
©
ISO 2020
© ISO 2020
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Fax: +41 22 749 09 47
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii © ISO 2020 – All rights reserved
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Abbreviated terms . 3
5 Radiation resistance design . 4
5.1 Overview . 4
5.2 Basic idea of using COTS parts . 5
5.2.1 Concept of parts selection. 5
5.2.2 COTS parts evaluation . 5
5.2.3 Concept of evaluation method . 5
5.2.4 Concept of application of COTS parts/consumer technology . 5
5.3 Space radiation environment prediction. 5
5.3.1 Space environment . 5
5.3.2 Space radiation environment model . 6
5.3.3 Various parameters . 6
5.3.4 Environmental conditions necessary for evaluation . 6
6 Radiation tolerance test . 7
6.1 Types of irradiation test . 7
6.1.1 Cobalt 60 (gamma ray) irradiation test . 7
6.1.2 Proton beam irradiation test . 7
6.1.3 Heavy ion test . 7
6.2 Alternative irradiation test — Laser pulse test. 7
6.3 Test procedure . 7
6.3.1 Total dose test . 7
6.3.2 Single event test . 7
6.3.3 Displacement damage test . 7
6.3.4 Laser pulse test for SEE test . 7
Annex A (informative) Radiation resistance design procedure . 8
Annex B (informative) Total dose prediction method .13
Annex C (informative) Radiation guidelines for total dose using contour maps .19
Annex D (informative) Comparative example between model prediction and measured values .23
Annex E (informative) Radiation deterioration of electronic components .25
Annex F (informative) Overview of single event effect .27
Annex G (informative) Measures for single events of electronic components .29
Annex H (informative) Measures for single events of devices .31
Annex I (informative) Prediction method of displacement damage .33
Annex J (informative) Resistance for displacement damage of each device .35
Annex K (informative) Displacement damage test guideline for semiconductor device .38
Annex L (informative) Laser pulse test method .44
Bibliography .46
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www .iso .org/ patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to
the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see
www .iso .org/ iso/ foreword .html.
This document was prepared by Technical Committee ISO/TC 20, Aircraft and space vehicles,
Subcommittee SC 14, Space systems and operations.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www .iso .org/ members .html.
iv © ISO 2020 – All rights reserved
Introduction
This document describes methods of evaluating the radiation effects on COTS (Commercial-Off-The-
Shelf) parts used in low Earth orbit (LEO) satellites. Many small (<180 kg) and nano/microsatellites
(1 kg to 50 kg) are launched to LEO altitudes where space radiation exists but is less than at higher
altitudes. As a result, the designers and manufacturers of such satellites are using COTS semiconductor
devices for their satellite components and boards. New industries taking advantage of nano/
microsatellite and CubeSat [1,33 kg × (1U-3U)] satellite capabilities now include IT ventures, mobile
phones, and internet industries along with universities and research institutions.
Satellite manufacturers who prioritize investment efficiency also aim to extend mission lifetimes (up
to three, five and ten years) longer than one-year missions that were common for educational and
technical demonstrations using nano/microsatellites.
Even with relatively lower space radiation conditions in LEO compared to higher orbits, a longer mission
life in LEO poses critical radiation environment constraints for COTS devices onboard small and nano/
microsatellites as well as CubeSats.
While there are methods of evaluating the radiation resistance of space parts, there are limited methods
for evaluating COTS parts used for LEO satellites and these are often based on legacy parts usage.
This document provides guidance for evaluating radiation tolerance of COTS parts that can help
increase confidence levels of longer-term mission lifetimes.
INTERNATIONAL STANDARD ISO 21980:2020(E)
Space systems — Evaluation of radiation effects on
Commercial-Off-The-Shelf (COTS) parts for use on low-orbit
satellite
1 Scope
This document outlines the evaluation methods for environmental tests that can be conducted on COTS
(Commercial-Off-The-Shelf) spacecraft parts intended for use on LEO satellites. The radiation effects
considered consist of total dosage, single event, and displacement damage. In addition, this document
describes tests that are useful for satellites operating in LEO.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminological databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
3.1
galactic cosmic rays
GCR
high-energy-charged particle fluxes (3.2) penetrating the heliosphere from local interstellar space
Note 1 to entry: Galactic cosmic rays are composed primarily of high-energy protons and atomic nuclei. Upon
impact with the Earth's atmosphere, cosmic rays can produce showers of secondary particles that sometimes
reach the Earth’s surface. There is evidence that a significant fraction of primary cosmic rays originate from
stellar supernova explosions and perhaps from active galactic nuclei.
[SOURCE: ISO 15390:2004, 2.1, modified — Note 1 to entry has been added.]
3.2
flux
number of particles passing through a specific unit area per unit time
[SOURCE: ISO 12208:2015, 2.3]
3.3
fluence
time-integrated flux (3.2)
Note 1 to entry: Fluence is measured as the flux per unit area per unit time. This is used to express the
environment during the operational lifetime of a spacecraft or space instrument. The integrated particles fluence
−2 −2 −1
unit is expressed as particles m . The energy integral fluence unit is expressed as particles m MeV . When the
−1
directional fluence is included, add per steradian ( sr ).
[SOURCE: ISO 12208:2015, 2.4, modified — Note 1 to entry has been added.]
3.4
absorbed dose
...
INTERNATIONAL ISO
STANDARD 21980
First edition
2020-01
Space systems — Evaluation of
radiation effects on Commercial-Off-
The-Shelf (COTS) parts for use on low-
orbit satellite
Systèmes spatiaux — Évaluation des effets des radiations sur les
parties commerciales sur étagère (COTS) destinées aux satellites à
orbite basse
Reference number
©
ISO 2020
© ISO 2020
All rights reserved. Unless otherwise specified, or required in the context of its implementation, no part of this publication may
be reproduced or utilized otherwise in any form or by any means, electronic or mechanical, including photocopying, or posting
on the internet or an intranet, without prior written permission. Permission can be requested from either ISO at the address
below or ISO’s member body in the country of the requester.
ISO copyright office
CP 401 • Ch. de Blandonnet 8
CH-1214 Vernier, Geneva
Phone: +41 22 749 01 11
Fax: +41 22 749 09 47
Email: copyright@iso.org
Website: www.iso.org
Published in Switzerland
ii © ISO 2020 – All rights reserved
Contents Page
Foreword .iv
Introduction .v
1 Scope . 1
2 Normative references . 1
3 Terms and definitions . 1
4 Abbreviated terms . 3
5 Radiation resistance design . 4
5.1 Overview . 4
5.2 Basic idea of using COTS parts . 5
5.2.1 Concept of parts selection. 5
5.2.2 COTS parts evaluation . 5
5.2.3 Concept of evaluation method . 5
5.2.4 Concept of application of COTS parts/consumer technology . 5
5.3 Space radiation environment prediction. 5
5.3.1 Space environment . 5
5.3.2 Space radiation environment model . 6
5.3.3 Various parameters . 6
5.3.4 Environmental conditions necessary for evaluation . 6
6 Radiation tolerance test . 7
6.1 Types of irradiation test . 7
6.1.1 Cobalt 60 (gamma ray) irradiation test . 7
6.1.2 Proton beam irradiation test . 7
6.1.3 Heavy ion test . 7
6.2 Alternative irradiation test — Laser pulse test. 7
6.3 Test procedure . 7
6.3.1 Total dose test . 7
6.3.2 Single event test . 7
6.3.3 Displacement damage test . 7
6.3.4 Laser pulse test for SEE test . 7
Annex A (informative) Radiation resistance design procedure . 8
Annex B (informative) Total dose prediction method .13
Annex C (informative) Radiation guidelines for total dose using contour maps .19
Annex D (informative) Comparative example between model prediction and measured values .23
Annex E (informative) Radiation deterioration of electronic components .25
Annex F (informative) Overview of single event effect .27
Annex G (informative) Measures for single events of electronic components .29
Annex H (informative) Measures for single events of devices .31
Annex I (informative) Prediction method of displacement damage .33
Annex J (informative) Resistance for displacement damage of each device .35
Annex K (informative) Displacement damage test guideline for semiconductor device .38
Annex L (informative) Laser pulse test method .44
Bibliography .46
Foreword
ISO (the International Organization for Standardization) is a worldwide federation of national standards
bodies (ISO member bodies). The work of preparing International Standards is normally carried out
through ISO technical committees. Each member body interested in a subject for which a technical
committee has been established has the right to be represented on that committee. International
organizations, governmental and non-governmental, in liaison with ISO, also take part in the work.
ISO collaborates closely with the International Electrotechnical Commission (IEC) on all matters of
electrotechnical standardization.
The procedures used to develop this document and those intended for its further maintenance are
described in the ISO/IEC Directives, Part 1. In particular, the different approval criteria needed for the
different types of ISO documents should be noted. This document was drafted in accordance with the
editorial rules of the ISO/IEC Directives, Part 2 (see www .iso .org/ directives).
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. ISO shall not be held responsible for identifying any or all such patent rights. Details of
any patent rights identified during the development of the document will be in the Introduction and/or
on the ISO list of patent declarations received (see www .iso .org/ patents).
Any trade name used in this document is information given for the convenience of users and does not
constitute an endorsement.
For an explanation of the voluntary nature of standards, the meaning of ISO specific terms and
expressions related to conformity assessment, as well as information about ISO's adherence to
the World Trade Organization (WTO) principles in the Technical Barriers to Trade (TBT), see
www .iso .org/ iso/ foreword .html.
This document was prepared by Technical Committee ISO/TC 20, Aircraft and space vehicles,
Subcommittee SC 14, Space systems and operations.
Any feedback or questions on this document should be directed to the user’s national standards body. A
complete listing of these bodies can be found at www .iso .org/ members .html.
iv © ISO 2020 – All rights reserved
Introduction
This document describes methods of evaluating the radiation effects on COTS (Commercial-Off-The-
Shelf) parts used in low Earth orbit (LEO) satellites. Many small (<180 kg) and nano/microsatellites
(1 kg to 50 kg) are launched to LEO altitudes where space radiation exists but is less than at higher
altitudes. As a result, the designers and manufacturers of such satellites are using COTS semiconductor
devices for their satellite components and boards. New industries taking advantage of nano/
microsatellite and CubeSat [1,33 kg × (1U-3U)] satellite capabilities now include IT ventures, mobile
phones, and internet industries along with universities and research institutions.
Satellite manufacturers who prioritize investment efficiency also aim to extend mission lifetimes (up
to three, five and ten years) longer than one-year missions that were common for educational and
technical demonstrations using nano/microsatellites.
Even with relatively lower space radiation conditions in LEO compared to higher orbits, a longer mission
life in LEO poses critical radiation environment constraints for COTS devices onboard small and nano/
microsatellites as well as CubeSats.
While there are methods of evaluating the radiation resistance of space parts, there are limited methods
for evaluating COTS parts used for LEO satellites and these are often based on legacy parts usage.
This document provides guidance for evaluating radiation tolerance of COTS parts that can help
increase confidence levels of longer-term mission lifetimes.
INTERNATIONAL STANDARD ISO 21980:2020(E)
Space systems — Evaluation of radiation effects on
Commercial-Off-The-Shelf (COTS) parts for use on low-orbit
satellite
1 Scope
This document outlines the evaluation methods for environmental tests that can be conducted on COTS
(Commercial-Off-The-Shelf) spacecraft parts intended for use on LEO satellites. The radiation effects
considered consist of total dosage, single event, and displacement damage. In addition, this document
describes tests that are useful for satellites operating in LEO.
2 Normative references
There are no normative references in this document.
3 Terms and definitions
For the purposes of this document, the following terms and definitions apply.
ISO and IEC maintain terminological databases for use in standardization at the following addresses:
— ISO Online browsing platform: available at https:// www .iso .org/ obp
— IEC Electropedia: available at http:// www .electropedia .org/
3.1
galactic cosmic rays
GCR
high-energy-charged particle fluxes (3.2) penetrating the heliosphere from local interstellar space
Note 1 to entry: Galactic cosmic rays are composed primarily of high-energy protons and atomic nuclei. Upon
impact with the Earth's atmosphere, cosmic rays can produce showers of secondary particles that sometimes
reach the Earth’s surface. There is evidence that a significant fraction of primary cosmic rays originate from
stellar supernova explosions and perhaps from active galactic nuclei.
[SOURCE: ISO 15390:2004, 2.1, modified — Note 1 to entry has been added.]
3.2
flux
number of particles passing through a specific unit area per unit time
[SOURCE: ISO 12208:2015, 2.3]
3.3
fluence
time-integrated flux (3.2)
Note 1 to entry: Fluence is measured as the flux per unit area per unit time. This is used to express the
environment during the operational lifetime of a spacecraft or space instrument. The integrated particles fluence
−2 −2 −1
unit is expressed as particles m . The energy integral fluence unit is expressed as particles m MeV . When the
−1
directional fluence is included, add per steradian ( sr ).
[SOURCE: ISO 12208:2015, 2.4, modified — Note 1 to entry has been added.]
3.4
absorbed dose
...
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