IEC PAS 60512-27-200:2018

IEC PAS 60512-27-200 ®
Edition 1.0 2018-10
PUBLICLY AVAILABLE
SPECIFICATION
PRE-STANDARD
colour
inside
Connectors for electrical and electronic equipment – Tests and measurements –
Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz on
IEC 60603-7 series connectors – Tests 27a to 27g

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IEC PAS 60512-27-200 ®
Edition 1.0 2018-10
PUBLICLY AVAILABLE
SPECIFICATION
PRE-STANDARD
colour
inside
Connectors for electrical and electronic equipment – Tests and measurements –

Part 27-200: Additional specifications for signal integrity tests up to 2 000 MHz on

IEC 60603-7 series connectors – Tests 27a to 27g

INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
ICS 31.220.10 ISBN 978-2-8322-6093-7

– 2 – IEC PAS 60512-27-200:2018 © IEC 2018
CONTENTS
FOREWORD . 8
1 Scope . 10
2 Normative references . 10
3 Terms and definitions . 12
4 Overall test arrangement . 12
4.1 General . 12
4.2 Indirect-reference test fixtures . 12
Annex A (normative) Indirect-reference test fixtures . 13
A.1 General . 13
A.2 Requirements . 13
Annex B (normative) Measurement requirements (general) . 14
B.1 General test configuration . 14
B.2 Termination of a cable DUT to test system . 14
B.2.1 General . 14
B.2.2 Interconnections between the device under test (DUT) and the
calibration plane . 15
B.2.3 Test lead return loss requirements . 15
B.2.4 Ground plane requirements . 18
B.2.5 Network analyzer requirements . 18
B.3 Measurement points and spacing . 18
B.4 Impedance matching terminations . 19
B.4.1 General . 19
B.4.2 Resistor terminations . 19
B.4.3 Termination return loss performance at the calibration plane . 20
B.4.4 Termination TCL performance at the calibration plane . 20
B.4.5 Calibration methods . 20
B.4.6 Two-port calibration of the test system . 21
B.4.7 One-port calibration of the test system . 21
B.5 General calibration plane . 21
B.5.1 General . 21
B.5.2 Calibration references . 22
B.5.3 50 Ω and 100 Ω calibration reference load requirements . 22
B.5.4 Calibration reference load return loss requirement . 23
B.5.5 Typical test equipment performance parameters . 23
Annex C (normative) Cabling and component test procedures using baluns . 24
C.1 Measurement test setup and apparatus. 24
C.1.1 General . 24
C.1.2 Balun terminations . 24
C.1.3 Balun requirements. 24
C.2 Testing of cabling . 26
C.2.1 Cabling DC resistance . 26
C.2.2 Return loss testing of cables and channels . 27
C.2.3 Insertion loss of cables and channels . 29
C.2.4 NEXT loss of cables and channels . 30
C.2.5 FEXT loss of cables and channels . 32
C.2.6 Cable and channel propagation delay . 34

C.2.7 TCL of cables and channels . 34
C.2.8 TCTL of cables and channels . 38
C.2.9 Cable and channel measurement precautions . 40
C.2.10 Screened or shielded cable and channel measurement configurations . 40
C.3 Permanent link test procedures . 40
C.3.1 General . 40
C.3.2 Permanent link measurement configurations . 40
C.3.3 Calibration of permanent link test configurations. . 41
C.3.4 Return loss of permanent links . 41
C.3.5 Insertion loss of permanent link . 42
C.3.6 NEXT loss of permanent link . 42
C.3.7 FEXT loss of permanent link . 43
C.3.8 TCL of permanent link . 44
C.3.9 TCTL of permanent link . 45
C.3.10 Propagation delay of permanent link . 46
C.4 Direct attach measurement procedures . 47
C.4.1 Direct attach test configurations. 47
C.5 Modular cord test procedures . 50
C.5.1 Network analyzer test configuration . 50
C.5.2 Test fixturing for modular cords . 52
C.5.3 Modular cord measurements. . 52
C.6 Connecting hardware testing . 52
C.6.1 General . 52
C.6.2 Connecting hardware measurement configurations . 52
C.6.3 Return loss measurements . 53
C.6.4 Insertion loss measurements . 53
C.6.5 NEXT loss measurements . 54
C.6.6 Test plug characterization . 56
C.6.7 Category 6A measurement reproducibility . 72
C.7 Modular cord test head requirements . 74
C.7.1 General . 74
C.7.2 Modular cord test head NEXT loss . 74
C.7.3 Modular cord test head FEXT loss . 74
C.7.4 Modular cord test head return loss . 75
C.8 Alien crosstalk measurements . 75
C.8.1 Cabling ANEXT loss and AFEXT loss laboratory measurement
procedures . 75
C.8.2 ANEXT loss and AFEXT loss of cable . 77
C.8.3 Connecting Hardware ANEXT loss and AFEXT loss measurements . 79
Annex D (normative) Cabling and component balunless test procedures . 83
D.1 Balunless measurement requirements . 83
D.2 Resistor terminations used with balunless measurement systems . 83
D.3 Calibration methods . 84
D.4 Testing of cables and cabling . 84
D.4.1 Cabling and cable measurement procedures . 84
D.4.2 Cabling and cable DC resistance . 85
D.4.3 Cabling and cable return loss . 85
D.4.4 Insertion loss of cables and channels . 86
D.4.5 NEXT loss of cables and channels . 87

– 4 – IEC PAS 60512-27-200:2018 © IEC 2018
D.4.6 FEXT loss of cables and channels . 87
D.4.7
...