EN 62798:2014

SLOVENSKI STANDARD
01-junij-2015
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Industrial electroheating equipment - Test methods for infrared emitters
Ta slovenski standard je istoveten z: EN 62798:2014
ICS:
25.180.10 (OHNWULþQHSHþL Electric furnaces
2003-01.Slovenski inštitut za standardizacijo. Razmnoževanje celote ali delov tega standarda ni dovoljeno.

EUROPEAN STANDARD EN 62798
NORME EUROPÉENNE
EUROPÄISCHE NORM
October 2014
ICS 25.180.10
English Version
Industrial electroheating equipment -
Test methods for infrared emitters
(IEC 62798:2014)
Chauffage électrique industriel - Méthodes d'essais des Industrielle Elektrowärmeeinrichtungen - Prüfverfahren für
émetteurs de rayonnement infrarouge Infrarotstrahler
(CEI 62798:2014) (IEC 62798:2014)
This European Standard was approved by CENELEC on 2014-09-29. CENELEC members are bound to comply with the CEN/CENELEC
Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration.
Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the CEN-CENELEC
Management Centre or to any CENELEC member.
This European Standard exists in three official versions (English, French, German). A version in any other language made by translation
under the responsibility of a CENELEC member into its own language and notified to the CEN-CENELEC Management Centre has the
same status as the official versions.
CENELEC members are the national electrotechnical committees of Austria, Belgium, Bulgaria, Croatia, Cyprus, the Czech Republic,
Denmark, Estonia, Finland, Former Yugoslav Republic of Macedonia, France, Germany, Greece, Hungary, Iceland, Ireland, Italy, Latvia,
Lithuania, Luxembourg, Malta, the Netherlands, Norway, Poland, Portugal, Romania, Slovakia, Slovenia, Spain, Sweden, Switzerland,
Turkey and the United Kingdom.

European Committee for Electrotechnical Standardization
Comité Européen de Normalisation Electrotechnique
Europäisches Komitee für Elektrotechnische Normung
CEN-CENELEC Management Centre: Avenue Marnix 17, B-1000 Brussels
© 2014 CENELEC All rights of exploitation in any form and by any means reserved worldwide for CENELEC Members.
Ref. No. EN 62798:2014 E
Foreword
The text of document 27/938/CDV, future edition 1 of IEC 62798, prepared by IEC/TC 27 "Industrial
electroheating and electromagnetic processing" was submitted to the IEC-CENELEC parallel vote and
approved by CENELEC as EN 62798:2014.

The following dates are fixed:
(dop) 2015-06-29
• latest date by which the document has to be
implemented at national level by
publication of an identical national
standard or by endorsement
• latest date by which the national (dow) 2017-09-29
standards conflicting with the
document have to be withdrawn
Attention is drawn to the possibility that some of the elements of this document may be the subject of
patent rights. CENELEC [and/or CEN] shall not be held responsible for identifying any or all such
patent rights.
Endorsement notice
The text of the International Standard IEC 62798:2014 was approved by CENELEC as a European
Standard without any modification.
In the official version, for Bibliography, the following notes have to be added for the standards indicated:

IEC 60519-1:2010 NOTE Harmonized as EN 60519-1:2011 (not modified).
IEC 62471:2006 NOTE Harmonized as EN 62471:2008 (modified).
IEC 60079-0 NOTE Harmonized as EN 60079-0.

- 3 - EN 62798:2014
Annex ZA
(normative)
Normative references to international publications
with their corresponding European publications

The following documents, in whole or in part, are normatively referenced in this document and are
indispensable for its application. For dated references, only the edition cited applies. For undated
references, the latest edition of the referenced document (including any amendments) applies.

NOTE 1 When an International Publication has been modified by common modifications, indicated by (mod), the relevant
EN/HD applies.
NOTE 2 Up-to-date information on the latest versions of the European Standards listed in this annex is available here:
www.cenelec.eu
Publication Year Title EN/HD Year

Methods of test for dense shaped EN 993-11
refractory products -
Part 11: Determination of resistance to
thermal shock
IEC 60061-1 -  Lamp caps and holders together with EN 60061-1 -
gauges for the control of interchangeability
and safety -
Part 1: Lamp caps
IEC 60061-2 -  Lamp caps and holders together with EN 60061-2 -
gauges for the control of interchangeability
and safety -
Part 2: Lampholders
IEC 60061-3 -  Lamp caps and holders together with EN 60061-3 -
gauges for the control of interchangeability
and safety -
Part 3: Gauges
IEC 60068-2-6 -  Environmental testing - EN 60068-2-6 -
Part 2-6: Tests - Test Fc: Vibration
(sinusoidal)
IEC 60068-2-7 -  Basic environmental testing procedures - EN 60068-2-7 -
Part 2-7: Tests - Test Ga and guidance:
Acceleration, steady state
IEC 60432-1 (mod) 1999 Incandescent lamps - Safety EN 60432-1 2000
specifications -
+A1 2005 +A1 2005
Part 1: Tungsten filament lamps for
+A2 2011 +A2 2012
domestic and similar general lighting
purposes
IEC 60519-12 -  Safety in electroheating installations - EN 60519-12 -
Part 12: Particular requirements for
infrared electroheating installations
IEC 60682 1980 Standard method of measuring the pinch EN 60682 1993
temperature of quartz-tungstenhalogen
+A1 1987
lamps
+A2 1997 +A2 1997
IEC 62693 2013 Industrial electroheating installations - EN 62693 2013
Test methods for infrared electroheating
installations
IEC 62798 ®
Edition 1.0 2014-08
INTERNATIONAL
STANDARD
NORME
INTERNATIONALE
Industrial electroheating equipment – Test methods for infrared emitters

Chauffage électrique industriel – Méthodes d’essais des émetteurs de

rayonnement infrarouge
INTERNATIONAL
ELECTROTECHNICAL
COMMISSION
COMMISSION
ELECTROTECHNIQUE
PRICE CODE
INTERNATIONALE
X
CODE PRIX
ICS 25.180.10 ISBN 978-2-8322-1837-2

– 2 – IEC 62798:2014 © IEC 2014
CONTENTS
FOREWORD . 5
INTR ODUCTION . 6
1  Scope and object . 7
2  Normative references. 8
3  Terms and definitions . 8
3.1  General . 8
3.2  Radiation . 9
4  Classification of infrared emitters . 10
5  Type of tests and general conditions of their performance . 12
5.1  General – list of tests . 12
5.2  Test conditions . 15
5.2.1  Operating conditions during tests . 15
5.2.2  Standard environment for tests . 15
5.2.3  Non-standard environment for tests . 15
5.2.4  Supply voltage . 15
5.3  Stationary condition . 16
5.4  Number of emitters for tests . 16
6  Measurements . 16
6.1  General . 16
6.2  Time resolution . 16
6.3  Measurement of electric data . 16
6.4  Temperature measurement . 17
6.5  Irradiance and radiance measurement . 17
6.6  Spectral measurements . 18
6.6.1  General . 18
6.6.2  Calculation as a surrogate for measurement . 18
6.6.3  Required spectral range . 18
6.6.4  Measurement conditions . 18
6.6.5  Spectral meas urement s . 19
7  Technical tests . 19
7.1  General . 19
7.2  Tests concerning cap and holder of emitter . 19
7.2.1  General . 19
7.2.2  Cap and holder interchangeability . 19
7.2.3  Cap twist-off test . 19
7.3  Power consumption characteristics . 19
7.3.1  Rated power . 19
7.3.2  Variation of power with voltage . 19
7.3.3  Inrush current . 20
7.3.4  Emitter resistivity as estimate for rated power . 20
7.4  Emitter temperature tests . 20
7.4.1  Rated temperature . 20
7.4.2  Variation of source temperature with voltage . 21
7.4.3  Source temperature rise time . 21
7.4.4  Source temperature cooling time for quartz tube emitters . 22

IEC 62798:2014 © IEC 2014 – 3 –
7.4.5  Source temperature cooling time for other emitters . 22
7.4.6  Quartz tube cooling time for quartz tube emitters . 22
7.4.7  Source temperature distribution . 22
7.4.8  Average temperature calculation from a thermal image . 23
7.4.9  Surface temperature distribution . 23
7.4.10  Distribution temperature . 24
7.4.11  Thermal ruggedness . 25
7.4.12  Pinching temperature of pinched emitters . 25
7.5  Radiation characteristics . 25
7.5.1  General . 25
7.5.2  Radial irradiation distribution of tubular emitters . 26
7.5.3  Reflectivity of a tubular emitter with applied reflector . 26
7.5.4  Planar irradiation field caused by an emitter . 26
7.5.5  Angular irradiation distribution caused by an emitter . 27
7.5.6  Emitted spectrum . 27
7.5.7  Rated total radiant power . 28
7.5.8  Irradiation reaction time . 29
7.6  Mechanical ruggedness . 29
7.6.1  Accelerat i on . 29
7.6.2  Vibration . 29
7.7  Lifetime of infrared emitters . 29
7.7.1  General . 29
7.7.2  Criteria defining end of life . 30
7.7.3  Lifetime measurement . 30
7.7.4  Induced lamp death for emitter with a tungsten coil . 31
7.7.5  Induced lamp death for other emitter . 31
7.7.6  Lifetime statement . 31
8  Emitter efficiency . 32
8.1  General . 32
8.2  Conversion efficiency . 32
8.3  Transfer efficiency . 32
8.3.1  General . 32
8.3.2  Simple approach . 33
8.3.3  Ray-tracing . 33
8.4  Irradiation efficiency . 33
Annex A (informative) Thermal infrared radiation . 34
A.1  General . 34
A.2  Spectral emission . 34
A.3  Emissivity . 36
A.4  Conservation of étendue . 36
Annex B (informative) Infrared classification not used in this standard. 37
Annex C (normative) Measurement of spectral emission and spectral data of the
emitter . . 38
C.1  General . 38
C.2  Comparative method . 38
C.3  Measurement of the spectral emissivity . 39
Annex D (informative) Zo nal spherical f a c tors . 40
Annex E (informative) Distribution of measurement positions for temperature
measurements . . 42

– 4 – IEC 62798:2014 © IEC 2014
E.1  Reference operating temperature . 42
E.2  Temperature distribution coefficient . 42
Annex F (informative) End of life criteria for infrared emitter . 43
Annex G (normative) Cold state resistivity and rated power. 45
G.1  General . 45
G.2  Measuring with high accuracy for comparison . 45
G.3  Temperature influences on measurement accuracy . 45
G.4  Emitter manufacturing effects . 46
G.5  Error contributions . 46
Bibliography . . 47

Figure A.1 – Spectral emissive power and accumulated power of a grey emitter at
1 800 °C . 35
Figure D.1 – Illustration of the measurement geometry for zonal spherical factors . 41

Table 1 – Classification of infrared emitters by spectral emission . 11
Table 2 – List of tests, their applicability to different classes of infrared emitters and
the number of emitters needed for the tests . 13
Table A.1 – The generalised Wien’s displacement law . 35
Table B.1 – Classification based on terms defined in IEC 60050-841:2004 . 37
Table D.1 – Zonal spherical factors and corresponding angles . 40
Table F.1 – Instantaneous end-of-life . 43
Table F.2 – Gradual degradation . 44

IEC 62798:2014 © IEC 2014 – 5 –
INTERNATIONAL ELECTROTECHNICAL COMMISSION
____________
INDUSTRIAL ELECTROHEATING EQUIPMENT –

Test methods for infrared emitters

FOREWORD
1) The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising
all national electrotechnical committees (IEC National Committees). The object of IEC is to promote
international co-operation on all questions concerning standardization in the electrical and electronic fields. To
this end and in addition to other activities, IEC publishes International Standards, Technical Specifications,
Technical Reports, Publicly Available Specifications (PAS) and Guides (hereafter referred to as “IEC
Publication(s)”). Their preparation is entrusted to technical committees; any IEC National Committee interested
in the subject dealt with may participate in this preparatory work. International, governmental and non-
governmental organizations liaising with the IEC also participate in this preparation. IEC collaborates closely
with the International Organization for Standardization (ISO) in accordance with conditions determined by
agreement between the two organizations.
2) The formal decisions or agreements of IEC on technical matters express, as nearly as possible, an international
consensus of opinion on the relevant subjects since each technical committee has representation from all
interested IEC National Committees.
3) IEC Publications have the form of recommendations for international use and are accepted by IEC National
Committees in that sense. While all reasonable efforts are made to ensure that the technical content of IEC
Publications is accurate, IEC cannot be held responsible for the way in which they are used or for any
misinterpretation by any end user.
4) In order to promote international uniformity, IEC National Committees undertake to apply IEC Publications
transparently to the maximum extent possible in their national and regional publications. Any divergence
between any IEC Publication and the corresponding national or regional publication shall be clearly indicated in
the latter.
5) IEC itself does not provide any attestation of conformity. Independent certification bodies provide conformity
assessment services and, in some areas, access to IEC marks of conformity. IEC is not responsible for any
services carried out by independent certification bodies.
6) All users should ensure that they have the latest edition of this publication.
7) No liability shall attach to IEC or its directors, employees, servants or agents including individual experts and
members of its technical committees and IEC National Committees for any personal injury, property damage or
other damage of any nature whatsoever, whether direct or indirect, or for costs (including legal fees) and
expenses arising out of the publication, use of, or reliance upon, this IEC Publication or any other IEC
Publications.
8) Attention is drawn to the Normative references cited in this publication. Use of the referenced publications is
indispensable for the correct application of this publication.
9) Attention is drawn to the possibility that some of the elements of this IEC Publication may be the subject of
patent rights. IEC shall not be held responsible for identifying any or all such patent rights.
International Standard IEC 62798 has been prepared by IEC technical committee 27:
Industrial electroheating and electromagnetic processing.
The text of this standard is based on the following documents:
CDV Report on voting
27/938/CDV 27/942/RVC
Full information on the voting for the approval of this standard can be found in the report on
voting indicated in the above table.
This publication has been drafted in accordance with the ISO/IEC Directives, Part 2.
The contents of the corrigendum of November 2014 have been included in this copy.

– 6 – IEC 62798:2014 © IEC 2014
INTRODUCTION
This standard on particular test methods for infrared electroheating emitters is one of TC 27
standards that describe test methods for various types of electroheating installations.
This standard is solely concerned with tests for infrared emitters. Tests that focus on the
performance of infrared equipment or installations are covered by IEC 62693, Industrial
electroheating installations – Test methods for infrared electroheating installations. The
rationale for this separation is that infrared installations are usually manufactured by other
companies than infrared emitters. Still, infrared emitters are a very important and distinct part
of infrared installations and a set of tests that allow for proper characterisation, comparison of
different infrared emitters is valuable to manufacturers of infrared installations.
The major guiding principle for this standard is to determine
– simple tests that define the basic characteristics of all infrared emitters and can be
performed with the usual test and measuring equipment available to different kinds of
companies, large or small;
– more complex tests that provide valuable extra information, but need a well-equipped
laboratory.
IEC 62798:2014 © IEC 2014 – 7 –
INDUSTRIAL ELECTROHEATING EQUIPMENT –

Test methods for infrared emitters

1 Scope and object
This International Standard specifies test procedures, conditions and methods according to
which the main parameters and the main operational characteristics of industrial infrared
emitters are established.
A limitation of the scope of this standard is that the infrared emitters have a maximum spectral
emission at longer wavelengths than 780 nm in air or vacuum, and are emitting wideband
continuous spectra such as by thermal radiation or high pressure arcs.
defines infrared as optical radiation within the frequency range
IEC 60519-1:2010 [1]
between about 400 THz and 300 GHz. This corresponds to the wavelength range between
780 nm and 1 mm in vacuum. Industrial infrared heating usually uses infrared sources with
rated temperatures between 500 °C and 3 000 °C; the emitted radiation from these sources
dominates in the wavelength range between 780 nm and 10 µm.
Industrial infrared emitters under the scope of this standard typically use the Joule effect for
the conversion of electric energy in one or several sources into infrared radiation, which is
emitted from one or several elements. Such infrared emitters are especially
– thermal infrared emitters in the form of tubular, plate-like or otherwise shaped ceramics
with a resistive element inside;
– infrared quartz glass tube or halogen lamp emitters with a hot filament as a source;
– non-insulated elements made from molybdenum-disilicide, silicon-carbide, iron-chromium-
aluminium alloys or comparable materials;
– wide-spectrum arc lamps.
This standard is not applicable to
– infrared emitters which are lasers or light-emitting diodes (LEDs);
– infrared emitters for use by the general public;
– infrared emitters for laboratory use.
Most of the tests described, especially the destructive tests, are for type testing.
The tests specified in this standard are intended to be used for evaluating or comparing the
performance of emitters belonging to the same category.
Tests related to performance of industrial infrared electroheating installations are specified in
IEC 62693:2013.
Most tests specified in this standard are applicable to wide-spectrum arc lamps, but not all.
___________
Numbers in square brackets refer to the Bibliography.

– 8 – IEC 62798:2014 © IEC 2014
2 Normative references
The following documents, in whole or in part, are normatively referenced in this document and
are indispensable for its application. For dated references, only the edition cited applies. For
undated references, the latest edition of the referenced document (including any
amendments) applies.
IEC 60061-1, Lamp caps and holders together with gauges for the control of
interchangeability and safety – Part 1: Lamp caps
IEC 60061-2, Lamp caps and holders together with gauges for the control of
interchangeability and safety – Part 2: Lampholders
IEC 60061-3, Lamp caps and holders together with gauges for the control of
interchangeability and safety – Part 3: Gauges
IEC 60068-2-6, Environmental testing – Part 2-6: Tests – Test Fc: Vibration (sinusoidal)
IEC 60068-2-7, Basic environmental testing procedures – Part 2-7: Tests – Test Ga and
guidance: Acceleration, steady state
IEC 60432-1:1999, Incandescent lamps – Safety specifications – Part 1: Tungsten filament
lamps for domestic and similar general lighting purposes
IEC 60432-1:1999/AMD1:2005
IEC 60432-1:1999/AMD2:2011
IEC 60519-12, Safety in electroheating installations – Part 12: Particular requirements for
infrared electroheating installations
IEC 60682:1980, Standard method of measuring the pinch temperature of quartz-tungsten-
halogen lamps
IEC 60682:1980/AMD1:1987
IEC 60682:1980/AMD2:1997
IEC 62693:2013, Industrial electroheating installations – Test methods for infrared
electroheating installations
EN 993-11, Methods of test for dense shaped refractory products – Part 11: Determination of
resistance to thermal shock
3 Terms and definitions
For the purposes of this document, the terms and definitions given in IEC 60519-12,
IEC 62693 as well as the following apply.
NOTE General definitions are given in the International Electrotechnical Vocabulary, IEC 60050 [2]. Terms
relating to industrial electroheating are defined in IEC 60050-841.
3.1 General
3.1.1
infrared radiation
optical radiation for which the wavelengths are longer than those for visible radiation
Note 1 to entry: The infrared radiation range between 780 nm and 1 mm is commonly subdivided into:
IR-A  780 nm to 1 400 nm, or for a grey emitter 3 450 °C to 1 800 °C surface temperature;
IR-B  1 400 nm to 3 000 nm, or for a grey emitter 1 800 °C to 690 °C surface temperature;

IEC 62798:2014 © IEC 2014 – 9 –
IR-C  3 000 nm to 1 mm, or for a grey emitter less than 690 °C surface temperature.
The temperature corresponds to a spectrum where maximum intensity is at the wavelength of the limit.
These ranges comply with IEC 62471:2006 [3].
Note 2 to entry: In IEC 60050-841:2004 the following terms are defined:
841-24-04 – shortwave infrared radiation or near infrared radiation (780 nm to 2 μm);
841-24-03 – mediumwave infrared radiation or medium infrared radiation (2 μm to 4 μm);
841-24-02 – longwave infrared radiation or far infrared radiation (4 μm to 1 mm).
These terms are not used in this standard.
[SOURCE: IEC 60519-12:2013, 3.101]
3.1.2
emitter category
group of emitters using the same principle for applying thermal energy to the workload
3.1.3
inrush current
short term high lamp current occurring during the transient period from the moment of
applying voltage to a cold emitter to steady state
3.1.4
average electrical lifetime
net operating time of infrared emitters at rated voltage under intended conditions when 50 %
of all emitters are still operating
3.2 Radiation
3.2.1
radiant power
radiant flux
power emitted, transmitted or received in the form of radiation
3.2.2
irradiance
irradiation
quotient of the radiant power incident on a surface element containing the point, by the area
of that element
3.2.3
radiance
dΦ
quantity L defined by the formula L=
dA⋅ cosθ⋅ dΩ
where
dΦ is the radiant power or flux transmitted by an elementary beam passing through the
given point and propagating in the solid angle containing the given direction;
dΩ is the solid angle;
dA is the area of a section of that beam containing the given point;
cosθ is the angle between the normal to that section and the direction of the beam.
3.2.4
radiant exitance,
quotient of the radiant flux emitted by a body into the hemispherical space (2π sr) by the
surface unit area of that body

– 10 – IEC 62798:2014 © IEC 2014
Note 1 to entry: The body can be an infrared emitter or a source of an infrared emitter.
3.2.5
spectral distribution
spectrum
quotient of a radiant quantity dX(λ) contained in an elementary range dλ of wavelength at the
wavelength λ by that range
Note 1 to entry: The term spectral distribution is preferred when dealing with the function Xλ(λ) over a wide range

of wavelengths, not at a particular wavelength.
3.2.6
spectral radiance
ratio of the radiant power dΦ(λ) passing through a point and propagating within the solid
angle dΩ in the given direction, to the product of the wavelength interval dλ and the area of a
section of that beam on a plane perpendicular to this direction ( cosθ⋅ dA) containing the given
point and to the solid angle dΩ
3.2.7
spectral radiant exitance
quotient of the radiant flux emitted by a body into the hemispherical space (2π sr) by the
surface unit area of that body and by the unit wavelength interval
3.2.8
radial irradiation distribution
irradiation caused by any emitter of axial symmetry on a circumference around the axis of
symmetry of the emitter on a plane perpendicular to that axis and centred at mid-length of the
emitter
Note 1 to entry: Axial symmetry does not imply round.
3.2.9
rated total radiant power
radiant power emitted by the emitter at rated voltage
4 Classification of infrared emitters
The most common industrial infrared emitters under the scope of this standard emit
broadband thermal spectra. Annex A provides basic definitions and concepts of thermal
infrared radiation. Thermal emitters usually have a clear correlation between the maximum of
the spectral radiant power and the temperature of the source of the emitter, called Wien’s law;
in this case the rated temperature indicates the spectrum of the emitter. Arc lamps generate a
non-thermal spectrum.
The most relevant design element of infrared emitters influencing the spatial irradiation
pattern is the size and dimension of the surface of the source emitting the radiation. As
industrial infrared emitters are usually used in close vicinity of the workload, there are
– very small sources which act like point sources – for example small light bulbs or arc
lamps with a very short arc; infrared laser and LED are point sources as well, but are
outside the scope of this standard;
– near ideal line sources – for example halogen emitter, tungsten coil emitter, arc or flash
lamps; their source may be bent;
– tubular or line sources with a large diameter – for example ceramic tube emitters, heating
rods made from materials like graphite or silicon carbide;
– planar or two-dimensional sources – for example ceramic tile type emitters.
Radiation sources can be divided into point like sources and extended sources depending on
the size of the source and observation distance. If the distance between the radiation source

IEC 62798:2014 © IEC 2014 – 11 –
of the emitter and the observation point is greater than 10 to 50 times the maximum
dimension of the radiation source, this source can be approximated as a point source. In most
industrial installations the infrared emitters are in close vicinity to the workload and are thus
extended sources. The approximate value of 10 to 50 depends on the problem and the
intended accuracy of a measurement.
NOTE 1 When the observing distance is greater than 10 times the maximum dimension of the radiation source,
the resulting error for calculating the irradiance is less than 1 %.
Commonly available industrial infrared emitters classified according to their spectral emission
and rated temperatures are listed in Table 1.
NOTE 2 In industry a different classification than the one used in this standard and given in 3.1.1 is also known, it
is provided for information in Annex B.
Table 1 – Classification of infrared emitters by spectral emission
Spectral band where
Rated temperature of
maximum of emission Category Comments
thermal emitter
occurs
IR-A 1 800 °C to 3 450 °C Other names for this
− halogen emitter
spectral range used in
− tungsten quartz tube
780 nm to 1 400 nm
industry are: near
emitter
infrared, NIR, short-
− high power laser
wave .
diodes
− light emitting diode
− arc lamp
IR-B 690 °C to 1 800 °C Other name for this
− halogen emitter
spectral range used in
− tungsten quartz tube
1 400 nm to 3 000 nm
industry is "medium-
emitter
wave" .
− ceramic emitter
− heating wire made
from nickel-chromium
alloys – nichrome
− heating wire made
from alloys of nickel-
chromium, or iron-
chromium-aluminium
− quartz tube emitter
with heating wire coil
(Cr, Al, Fe)
− quartz tube emitter
with carbon filament
− quartz tube emitter
with tungsten coil
− silicon carbide
heating rod
− graphite heating rod
− molybdenum
disilicide heating
element
− high temperature
metal tube element
− high temperature
ceramic element
IR-C Not in the scope of this
< 690 °C − metal tube element
standard, if convection
− ceramic emitter
3 000 nm to 1 mm
dominates.
element
included for reference only; rated temperature is not applicable
short wave and medium wave can denote differing spectral ranges, see Annex B

– 12 – IEC 62798:2014 © IEC 2014
5 Type of tests and general conditions of their performance
5.1 General – list of tests
Table 2 summarises the tests covered by this standard and their applicability to different
categories of infrared emitters. It also includes references to other standards with applicable
tests. Additional tests may be covered by commissioning and operation manuals issued by the
manufacturer or may be agreed on between the manufacturer and user.

IEC 62798:2014 © IEC 2014 – 13 –
Table 2 – List of tests, their applicability to different classes
of infrared emitters and the number of emitters needed for the tests
Emitter category Manufacturing
Open Ceramic
Test Subclause
Made to
heating heating Infrared quartz Halogen quartz Standard, mass produced
order
element element
emitter geometry - test is defined between the manufacturer and user
interchangeability of cap If cap and holder combinations from Parts 1, 2 and 3 of the IEC 60061 series are used, IEC 60061-3 is
7.2.1 not applicable
and holder, standard applicable.
interchangeability of cap 7.2.2
as agreed on between the manufacturer and user
and holder, other
cap twist-off test 7.2.3 not applicable IEC 60432-1 is applicable for caps covered by that standard
1/100 or
rated power 7.3.1 1/100
1/batch
applicable
power variation with
7.3.2
voltage
1 2
inrush current 7.3.3 usually not necessary usually applicable applicable 1/type 1/type
emitter resistivity as
7.3.4 may be applicable not applicable
estimate for rated power
rated temperature 7.4.1 IEC 60432-1 applies 1/batch
variation of source
7.4.2
temperature with voltage applicable
source temperature rise
7.4.3
time
source cooling in 7.4.4
7.4.4,
cooling time source cooling = surface cooling in 7.4.5
7.4.5, 7.4.6
surface cooling time in 7.4.6 1/type 1/type
temperature after change in production
7.4.8
homogeneity
surface temperature applicable
7.4.9
distribution
distribution temperature 7.4.10
thermal ruggedness 7.4.11 applicable non applicable application dependent 10/type

– 14 – IEC 62798:2014 © IEC 2014
Table 2 (continued)
Emitter category Manufacturing
Open Ceramic
Test Subclause
Made to
heating heating Infrared quartz Halogen quartz Standard, mass produced
order
element element
pinching temperature 7.4.12 not applicable IEC 60682
radial irradiation
distribution of tubular 7.5.2
emitters
applicable for emitters with line or tubular source
reflectivity of tubular
7.5.3
emitter
irradiation field on a
7.5.4
surface
1/type,
1/type
angular irradiation field 7.5.5
after change in production
7.5.6,
emitted spectrum
Annex C
applicable
rated total radiant power 7.5.7
irradiation reaction time 7.5.8
acceleration resistivity 7.6.1
vibration resistivity 7.6.2
lifetime measurement IEC 60432-1:1999,
7.7.3 refer to 7.7.1 not applicable
Annex D
7.7.4 not applicable, but may be agreed on between the manufacturer and user, refer to IEC 60432-1:1999,
induced lamp death not applicable
7.7.5 7.7.1 Annex D
lifetime statement 7.7.6 applicable, refer to 7.7.1 not applicable not applicable
Definitions used are:
– batch is a production batch or lot of a single product;
– type is an identifiable type differentiated by at least one specific unique characteristic from other emitters manufactured;
– changes in production are those changes that can affect the emitters manufactured and can affect the measurement results.
Applicable to filaments made from materials that show a noted increase of specific resistivity with temperature, like tungsten, molybdenum, osmium, platinum.

IEC 62798:2014 © IEC 2014 – 15 –
5.2 Test conditions
5.2.1 Operating conditions during tests
Operating conditions during the tests shall be in the range of normal operating conditions of
the emitter tested and thus reflect the manufacturer’s intended use of the product while
excluding extreme usage patterns, deliberate misuse or unauthorized modifications. Extreme
usage pattern may be agreed on between the manufacturer and user.
All environmental conditions that affect measurement results shall be monitored during the
tests and be part of the measurement report. This includes
a) environmental temperature including hot surfaces in the vicinity;
b) temperature of the air used for cooling;
c) relative and absolute humidity of the air at temperatures when condensation is expected to
occur, i.e. below 100 °C if applicable;
d) vibration or infrasound.
All tests shall be performed with the emitter radiating into free space, or only onto sufficiently
cooled and radiation absorbing surfaces at less than 50 °C in the vicinity to avoid any heating
of the emitter through the vicinity.
The emitter shall be positioned so that free convection is not hindered. Free convection is not
hindered if the distance to the next object in all directions including below the emitter is at
least 10 times the diameter of the emitter tube or 10 times the largest dimension of a planar
emitter.
5.2.2 Standard environment for tests
All tests shall be performed
a) under standardised environmental conditions, at ambient temperature in the range
between 5 °C and 40 °C and air relative humidity of less than 95 %,
b) at the altitude above sea level less than 1 000 m,
c) with no forced convection of the air applied unless otherwise stated.
The ambient temperature is considered as an average value. All quantities dependent on the
ambient temperature shall refer to the ambient temperature of 20 °C, the so-called reference
ambient temperature.
5.2.3 Non-standard environment for tests
All tests may be performed under conditions deviating from the standard environment as
defined in 5.2.2 if the infrared emitters are intended to be used under these condi
...